Germany successfully developed the ultrafine silicon nanoresonator. The width of this kind of nanoresonator made by the Ilmenau University of Technology is only 16 nanometers, which can be used as an atomic force microscope probe. The researchers claim that this achievement has epoch-making significance for the future development of atomic force microscopy and nano-analysis. Atomic force microscope is an analytical instrument that can be used to study the surface structure of solid materials including insulators. The key component is a micro-cantilever that is very sensitive to force. The cantilever tip has a tiny probe for scanning the surface of the sample. When the probe slightly contacts the surface of the sample, the micro cantilever bends due to the extremely weak interaction between the atoms at the tip of the probe and the atoms at the surface of the sample. Reconstructing the three-dimensional image according to the deviation of the probe or the vibration frequency when scanning the sample can indirectly obtain the topography or atomic composition of the sample surface. Atomic force microscope imaging has atomic resolution. Researchers at Ilmnau University of Technology say that the resonator they developed can further improve the resolution of the current atomic force microscope and record video for the first time in real time, which is equivalent to recording nanoscale biological, chemical and physical processes in the future with a video recorder. Future applications of this new invention include analysis of the molecular structure of bacteria, viruses, and DNA.
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